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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/253771
Title: Raman Scattering In Diamond Irradiated With High-Energy Xenon Ions
Authors: Kazuchits, N. M.
Korolik, O. V.
Rusetsky, M. S.
Kazuchits, V. N.
Kirilkin, N. S.
Skuratov, V. A.
Issue Date: 2020
Publisher: Elsevier
Citation: Nucl. Instrum. Methods Phys. Res. Section B: Beam Interactions with Materials and Atoms. – 2020. – Vol. 472. – P. 19–23.
Abstract: Accumulation of radiation damage and associated mechanical stresses in diamonds irradiated with 167 MeV Xe ions to fluences 1.0 × 10^10 ÷ 8.15 × 10^14 cm^−2 have been studied using confocal Raman spectroscopy. The spectra were measured in a backscattering geometry across the irradiated layer by scanning the edge of single crystalline synthetic samples with nitrogen concentration 3 ÷ 5 ppm. All spectra were recorded at room temperature. Parameters of the 1332 cm^−1 first-order Raman line – the FWHM and peak position, studied as function of Xe ion fluence, were used to characterize the structural disorder and mechanical stress level.
URI: https://elib.bsu.by/handle/123456789/253771
ISSN: 0168-583X
Scopus: 10.1016/j.nimb.2020.03.034
Appears in Collections:Кафедра физики полупроводников и наноэлектроники

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