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PreviewIssue DateTitleAuthor(s)
2019Structural evolution and photoluminescence of SiO2 layers with Sn nanoclusters formed by ion implantationRomanov, I.; Komarov, F.; Milchanin, O.; Vlasukova, L.; Parkhomenko, I.; Makhavikou, M.; Wendler, E.; Mudryi, A.; Togambayeva, A.
2019Experimental study and modeling of silicon supersaturated with selenium by ion implantation and nanosecond-laser meltingKomarov, F.F.; Ivlev, G.; Zayats, G.; Komarov, A.; Nechaev, N.; Parkhomenko, I.; Vlasukova, L.; Wendler, E.; Miskiewicz, S.
2012Structure and optical properties of silicon layers with GaSb nanocrystals created by ion-beam synthesisKomarov, F.; Vlasukova, L.; Milchanin, O.; Mudryi, A.; Dunets, B.; Wesch, W.; Wendler, E.
2011Structure and Optical Properties of Silicon Layers with GaSb Nanocrystals Created by Ion-Beam SynthesisKomarov, F.; Vlasukova, L.; Milchanin, O.; Mudryi, A.; Dunetz, B. S.; Wesch, W.; Wendler, E.; Karwat, C.
2016Ионно-лучевое формирование и трековая модификация нанокластеров InAs в кремнии и диоксиде кремнияКомаров, Ф. Ф.; Мильчанин, О. В.; Скуратов, В. А.; Моховиков, М. А.; van Vuuren, A. Janse; Neethling, J. N.; Wendler, E.; Власукова, Л. А.; Пархоменко, И. Н.; Ювченко, В. Н.
2016Ion-Beam Formation and Track Modification of InAs Nanoclusters in Silicon and SilicaKomarov, F. F.; Milchanin, O. V.; Skuratov, V. A.; Makhavikou, M. A.; van Vuuren, A. Janse; Neethling, J. N.; Wendler, E.; Vlasukova, L. A.; Parkhomenko, I. N.; Yuvchenko, V. N.
2014Threshold and criterion for ion track etching in SiO2layers grown on SiVlasukova, L. A.; Komarov, F. F.; Yuvchenko, V. N.; Wesch, W.; Wendler, E.; Didyk, A. Yu.; Skuratov, V. A.; Kislitsin, S. B.
2013Ion Beam Synthesis of InAs Nanocrystals in Si: Influence of Thin Surface Oxide LayersKomarov, F.; Vlasukova, L.; Milchanin, O.; Greben, M.; Komarov, A.; Mudryi, A.; Wesch, W.; Wendler, E.; Zuk, J.; Kulik, M.; Ismailova, G.
2021Luminescence of ZnO nanocrystals in silica synthesized by dual (Zn, O) implantation and thermal annealingParkhomenko, I.; Vlasukova, L.; Komarov, F.; Makhavikou, M.; Milchanin, O.; Wendler, E.; Zapf, M.; Ronning, C.