Logo BSU

Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/329537
Title: Migration of impurity Ni atomic clusters in Si lattice
Authors: Ismaylov, B. K.
Zikrillayev, Z. N.
Ismailov, K. A.
Kenzhaev, Z. T.
Saparov, S. A.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2025
Publisher: Минск : БГУ
Citation: Материалы и структуры современной электроники : материалы XI Междунар. науч. конф., Минск, 16–18 окт. 2024 г. / Белорус. гос. ун-т ; редкол.: В. Б. Оджаев (гл. ред.) [и др.]. – Минск : БГУ, 2025. – С. 6-9.
Abstract: New physical phenomenon, the migration of clusters of impurity nickel atoms in silicon, has been discovered. It was shown that clusters move in the silicon lattice with a high diffusion coefficient (DNi ~ 10–9 cm2/s at T = 800 °C). The composition of the clusters is determined, its structure and diffusion mechanism are proposed. It was shown that it is possible to control the state of clusters in the crystal lattice, thus, to obtain semiconductor materials of a new type with unique functional capabilities, using the process of migration of clusters of impurity nickel atoms
Description: Свойства, диагностика и применение полупроводниковых материалов и структур на их основе
URI: https://elib.bsu.by/handle/123456789/329537
ISBN: 978-985-881-739-8
Licence: info:eu-repo/semantics/openAccess
Appears in Collections:2024. Материалы и структуры современной электроники

Files in This Item:
File Description SizeFormat 
6-9.pdf338,71 kBAdobe PDFView/Open
Show full item record Google Scholar



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.