Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/113499| Title: | Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction |
| Authors: | Benediktovitch, A. I. Zhylik, Alexei Ulyanenkova, Tatjana Myronov, Maksym Ulyanenkov, A. |
| Keywords: | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика |
| Issue Date: | 2015 |
| Citation: | J. Appl. Cryst. (2015). 48 |
| URI: | http://elib.bsu.by/handle/123456789/113499 |
| Appears in Collections: | Кафедра теоретической физики и астрофизики (статьи) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2015'Benediktovitch_JAC.pdf | 1 MB | Adobe PDF | View/Open |
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