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Please use this identifier to cite or link to this item: http://elib.bsu.by/handle/123456789/113499
Title: Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction
Authors: Benediktovitch, A. I.
Zhylik, Alexei
Ulyanenkova, Tatjana
Myronov, Maksym
Ulyanenkov, A.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2015
Citation: J. Appl. Cryst. (2015). 48
URI: http://elib.bsu.by/handle/123456789/113499
Appears in Collections:Кафедра теоретической физики и астрофизики

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