Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/8272| Title: | Atomic Computer Simulations of Defect Migration in 3C and 4H-SIC |
| Authors: | Gao, F. Weber, W. J. Posselt, M. Belko, V. I. |
| Keywords: | ЭБ БГУ::ОБЩЕСТВЕННЫЕ НАУКИ::Информатика |
| Issue Date: | 2004 |
| URI: | http://elib.bsu.by/handle/123456789/8272 |
| Appears in Collections: | Статьи факультета прикладной математики и информатики |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| abstract_forum_Belko.pdf | 35,62 kB | Adobe PDF | View/Open |
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