Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/8272Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Gao, F. | - |
| dc.contributor.author | Weber, W. J. | - |
| dc.contributor.author | Posselt, M. | - |
| dc.contributor.author | Belko, V. I. | - |
| dc.date.accessioned | 2012-05-10T20:06:11Z | - |
| dc.date.available | 2012-05-10T20:06:11Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.uri | http://elib.bsu.by/handle/123456789/8272 | - |
| dc.language.iso | en | ru |
| dc.subject | ЭБ БГУ::ОБЩЕСТВЕННЫЕ НАУКИ::Информатика | ru |
| dc.title | Atomic Computer Simulations of Defect Migration in 3C and 4H-SIC | ru |
| dc.type | Article | ru |
| Appears in Collections: | Статьи факультета прикладной математики и информатики | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| abstract_forum_Belko.pdf | 35,62 kB | Adobe PDF | View/Open |
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