Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/53834
Title: | Multi-layer SOM neural network for IC-items detection on photo-snapshot images of poly-silicon layer |
Authors: | Vatkin, M. E. |
Keywords: | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Математика |
Issue Date: | 2003 |
Publisher: | Минск, БГУ |
Abstract: | The structure of multi-layer SOM neural network for structural items detection on a gray scale image of an integrated circuit (1С) is considered. The IC-items shape distortions invariant neural network structure and training rule are represented. The comparative outcomes of recognition have shown an advantage of neural network approach. |
URI: | http://elib.bsu.by/handle/123456789/53834 |
Appears in Collections: | Chapter 5. ARCHITECTURES FOR IMAGE PROCESSING |
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