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|Title:||Multi-layer SOM neural network for IC-items detection on photo-snapshot images of poly-silicon layer|
|Authors:||Vatkin, M. E.|
|Keywords:||ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Математика|
|Abstract:||The structure of multi-layer SOM neural network for structural items detection on a gray scale image of an integrated circuit (1С) is considered. The IC-items shape distortions invariant neural network structure and training rule are represented. The comparative outcomes of recognition have shown an advantage of neural network approach.|
|Appears in Collections:||Chapter 5. ARCHITECTURES FOR IMAGE PROCESSING|
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