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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/53834
Title: Multi-layer SOM neural network for IC-items detection on photo-snapshot images of poly-silicon layer
Authors: Vatkin, M. E.
Issue Date: 2003
Publisher: Минск, БГУ
Abstract: The structure of multi-layer SOM neural network for structural items detection on a gray scale image of an integrated circuit (1С) is considered. The IC-items shape distortions invariant neural network structure and training rule are represented. The comparative outcomes of recognition have shown an advantage of neural network approach.
URI: http://elib.bsu.by/handle/123456789/53834
Appears in Collections:Chapter 5. ARCHITECTURES FOR IMAGE PROCESSING

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