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https://elib.bsu.by/handle/123456789/48732| Title: | XPS study of fluorine implantation unduced centres in fused silica |
| Authors: | Deshkovskaya, A. Shchukarev, A. |
| Keywords: | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика |
| Issue Date: | 2013 |
| Abstract: | The X-ray photoelectron spectrometry (XPS) was used to study the fused silica surface implanted by fluorine (E=100 keV, F=3x1017 cm2). The study revealed three kinds of centres associated with the implanted atoms. Two of them have similar chemical nature: there fluorine forms octahedra (SiF6 -2) and tetrahedra (SiF4); the third kind of centres basically differs from the first two as, they are not bound with the silicate matrix. |
| URI: | http://elib.bsu.by/handle/123456789/48732 |
| Appears in Collections: | 2013. Взаимодействие излучений с твердым телом |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Deshkovskaya.pdf | 1,45 MB | Adobe PDF | View/Open |
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