Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/340630| Title: | Microstructure and phase state of silicon carbide irradiated with helium ions |
| Authors: | Uglov, V.V. Kholad, V.M. Grinchuk, P.S. Kiyashko, M.M. Ivanov, I.A. Kozlovskiy, A.L. Zdorovets, M.V. 0000-0003-1929-4996 |
| Keywords: | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика ЭБ БГУ::ТЕХНИЧЕСКИЕ И ПРИКЛАДНЫЕ НАУКИ. ОТРАСЛИ ЭКОНОМИКИ::Электроника. Радиотехника |
| Issue Date: | 2022 |
| Publisher: | Kovcheg |
| Citation: | Plasma physics and plasma technology (PPPT-10) : CONTRIBUTED PAPERS, Minsk, 12–16 сентября 2022 года. – Minsk: «Kovcheg», 2022. – P. 213-216 |
| Abstract: | The structural and phase state of the initial and irradiated silicon carbide samples was studied by X-ray diffraction analysis (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM). |
| URI: | https://elib.bsu.by/handle/123456789/340630 |
| Licence: | info:eu-repo/semantics/openAccess |
| Appears in Collections: | Кафедра физики твердого тела и нанотехнологий (статьи) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Углов5.pdf | 1,13 MB | Adobe PDF | View/Open |
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