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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/339606
Title: Surface Morphology and Optical and Physical Properties of YVO4 Films
Authors: Bosak, N. A.
Chumakov, A. N.
Baran, L. V.
Malyutina-Bronskaya, V. V.
Raichenok, T. F.
Ivanov, A. A.
Kiris, V. V.
Dyatlova, E. M.
Shevchenok, A. A.
Buka, A. V.
Kuzmitskaya, A. S.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2025
Publisher: Springer
Citation: Journal of Applied Spectroscopy. — 2025. — Vol. 92, № 2. — P. 276-281.
Abstract: Nanostructured thin fi lms on silicon substrate were obtained by high-frequency pulse-periodic (f ~ 13 kHz) action of laser radiation with a wavelength of 1.064 μm and a power density of q = 64 MW/cm2 on yttrium vanadate YVO4 ceramics at a vacuum chamber pressure of p = 3 Pa. The morphology of thin YVO4 fi lms was studied using atomic force microscopy. Transmittance spectra of YVO4 fi lms were obtained in the visible, near, and mid-IR regions. The electrophysical characteristics of YVO4/Si structures were analyzed.
URI: https://elib.bsu.by/handle/123456789/339606
DOI: 10.1007/s10812-025-01908-y
Licence: info:eu-repo/semantics/restrictedAccess
Appears in Collections:Кафедра физики твердого тела и нанотехнологий (статьи)

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