Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/339606| Title: | Surface Morphology and Optical and Physical Properties of YVO4 Films |
| Authors: | Bosak, N. A. Chumakov, A. N. Baran, L. V. Malyutina-Bronskaya, V. V. Raichenok, T. F. Ivanov, A. A. Kiris, V. V. Dyatlova, E. M. Shevchenok, A. A. Buka, A. V. Kuzmitskaya, A. S. |
| Keywords: | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика |
| Issue Date: | 2025 |
| Publisher: | Springer |
| Citation: | Journal of Applied Spectroscopy. — 2025. — Vol. 92, № 2. — P. 276-281. |
| Abstract: | Nanostructured thin fi lms on silicon substrate were obtained by high-frequency pulse-periodic (f ~ 13 kHz) action of laser radiation with a wavelength of 1.064 μm and a power density of q = 64 MW/cm2 on yttrium vanadate YVO4 ceramics at a vacuum chamber pressure of p = 3 Pa. The morphology of thin YVO4 fi lms was studied using atomic force microscopy. Transmittance spectra of YVO4 fi lms were obtained in the visible, near, and mid-IR regions. The electrophysical characteristics of YVO4/Si structures were analyzed. |
| URI: | https://elib.bsu.by/handle/123456789/339606 |
| DOI: | 10.1007/s10812-025-01908-y |
| Licence: | info:eu-repo/semantics/restrictedAccess |
| Appears in Collections: | Кафедра физики твердого тела и нанотехнологий (статьи) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JPS-2_Baran.pdf | 450,91 kB | Adobe PDF | View/Open |
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