Surface Morphology and Optical and Physical Properties of YVO4 Films

Abstract

Nanostructured thin fi lms on silicon substrate were obtained by high-frequency pulse-periodic (f ~ 13 kHz) action of laser radiation with a wavelength of 1.064 μm and a power density of q = 64 MW/cm2 on yttrium vanadate YVO4 ceramics at a vacuum chamber pressure of p = 3 Pa. The morphology of thin YVO4 fi lms was studied using atomic force microscopy. Transmittance spectra of YVO4 fi lms were obtained in the visible, near, and mid-IR regions. The electrophysical characteristics of YVO4/Si structures were analyzed.