Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/23929| Title: | reevaluation of energy levels of oxygen-vacancy complex in silicon crystals: 1. weak compensation |
| Authors: | Makarenko, Leonid F |
| Issue Date: | 2001 |
| Publisher: | iop science |
| Citation: | Semiconductor Science and Technology, v. 16, no 7, p. 619 |
| URI: | http://elib.bsu.by/handle/123456789/23929 |
| ISSN: | 0268-1242 |
| Appears in Collections: | Математическое моделирование |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 5_2001_sst-pap.pdf | 181,7 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

