Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/23929Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Makarenko, Leonid F | - |
| dc.date.accessioned | 2012-11-16T12:20:36Z | - |
| dc.date.available | 2012-11-16T12:20:36Z | - |
| dc.date.issued | 2001 | - |
| dc.identifier.citation | Semiconductor Science and Technology, v. 16, no 7, p. 619 | ru |
| dc.identifier.issn | 0268-1242 | - |
| dc.identifier.uri | http://elib.bsu.by/handle/123456789/23929 | - |
| dc.language.iso | ru | ru |
| dc.publisher | iop science | ru |
| dc.title | reevaluation of energy levels of oxygen-vacancy complex in silicon crystals: 1. weak compensation | ru |
| dc.type | Article | ru |
| Appears in Collections: | Математическое моделирование | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 5_2001_sst-pap.pdf | 181,7 kB | Adobe PDF | View/Open |
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