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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/23929
Title: reevaluation of energy levels of oxygen-vacancy complex in silicon crystals: 1. weak compensation
Authors: Makarenko, Leonid F
Issue Date: 2001
Publisher: iop science
Citation: Semiconductor Science and Technology, v. 16, no 7, p. 619
URI: http://elib.bsu.by/handle/123456789/23929
ISSN: 0268-1242
Appears in Collections:Математическое моделирование

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