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https://elib.bsu.by/handle/123456789/182633| Title: | Effect of annealing on the Structure of thermal evaporated In2S3 thin films |
| Authors: | Gremenok, V. F. Ramakrishna Reddy, K. T. Tivanov, M. S. Patryn, A. A. |
| Keywords: | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика |
| Issue Date: | Aug-2017 |
| Publisher: | Society of Polish Electrical and Electronics Engineers |
| Citation: | Electrical Review. - 2017. - R. 93, № 8. - P. 89-91. |
| Abstract: | Structural studies on In2S3 thin films deposited by vacuum thermal evaporation on glass substrates at a temperature of 240°C, followed by annealing at 330°C and 400°C are presented. It was shown that the films were of amorphous in nature before annealing and after annealing the films became polycrystalline and showed β- In2S3 structure. The grain size increased and followed the usual crystal growth process as the annealing temperature increased. The annealing-induced changes of surface roughness were characterized by atomic force microscopy. |
| URI: | http://elib.bsu.by/handle/123456789/182633 |
| ISSN: | 0033-2097 |
| Appears in Collections: | Кафедра физики твердого тела и нанотехнологий (статьи) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Effect of annealing on the structure of thermal evaporated In2S3 thin films.pdf | 389,09 kB | Adobe PDF | View/Open |
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