Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/156829| Title: | Determination of CdSxSe1-x thick films optical properties from reflection spectra |
| Authors: | Tivanov, M. S. Kaputskaya, I. A. Patryn, A. A. Saad, A. M. Survilo, L. Ostretsov, E. |
| Keywords: | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика |
| Issue Date: | Aug-2016 |
| Publisher: | Society of Polish Electrical and Electronics Engineers |
| Citation: | Electrical Review. - 2016. - Vol. 92, № 9. - P. 88 - 90 |
| Abstract: | A method for determining the band gap value and the refractive index near the absorption edge from reflection spectra was tested for CdSxSe1-x films prepared using the screen-printing and sintering technique. |
| URI: | http://elib.bsu.by/handle/123456789/156829 |
| ISSN: | 0033-2097 |
| Appears in Collections: | Кафедра физики твердого тела и нанотехнологий (статьи) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Determination of CdSxSe1-x thick films optical properties from reflection spectra.pdf | 244,76 kB | Adobe PDF | View/Open |
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