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Please use this identifier to cite or link to this item: http://elib.bsu.by/handle/123456789/156829
Title: Determination of CdSxSe1-x thick films optical properties from reflection spectra
Authors: Tivanov, M. S.
Kaputskaya, I. A.
Patryn, A. A.
Saad, A. M.
Survilo, L.
Ostretsov, E.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: Aug-2016
Publisher: Society of Polish Electrical and Electronics Engineers
Citation: Electrical Review. - 2016. - Vol. 92, № 9. - P. 88 - 90
Abstract: A method for determining the band gap value and the refractive index near the absorption edge from reflection spectra was tested for CdSxSe1-x films prepared using the screen-printing and sintering technique.
URI: http://elib.bsu.by/handle/123456789/156829
ISSN: 0033-2097
Appears in Collections:Кафедра энергофизики

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