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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/264722
Title: Pt silicide/poly-Si Schottky diodes as temperature sensors for bolometers
Authors: Yuryev, V.A.
Chizh, K.V.
Chapnin, V.A.
Mironov, S.A.
Dubkov, V.P.
Uvarov, O.V.
Kalinushkin, V.P.
Senkov, V.M.
Nalivaiko, O.Y.
Novikau, A.G.
Gaiduk, P.I.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2015
Publisher: American Institute of Physics Inc.
Citation: J Appl Phys 2015;117(20).
Abstract: Platinum silicide Schottky diodes formed on films of polycrystalline Si doped by phosphorus are demonstrated to be efficient and manufacturable CMOS-compatible temperature sensors for microbolometer detectors of radiation. Thin-film platinum silicide/poly-Si diodes have been produced by a CMOS-compatible process on artificial Si3N4/SiO2/Si(001) substrates simulating the bolometer cells. Layer structure and phase composition of the original Pt/poly-Si films and the Pt silicide/poly-Si films synthesized by a low-temperature process have been studied by means of the scanning transmission electron microscopy; they have also been explored by means of the two-wavelength X-ray structural phase analysis and the X-ray photoelectron spectroscopy. Temperature coefficient of voltage for the forward current of a single diode is shown to reach the value of about -2%/ °C in the temperature interval from 25 to 50 °C.
URI: https://elib.bsu.by/handle/123456789/264722
DOI: 10.1063/1.4921595
Scopus: 84930079192
Sponsorship: Seventh Framework Programme (FP7), 298932
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