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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/228619
Title: Morphology of WTi thin film processing by femtosecond laser
Authors: Petrović, S.
Gaković, B.
Peruško, D.
Trtica, M.
Jelenković, B.
Stratakis, E.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2012
Publisher: Минск : Ковчег
Citation: Физика и диагностика лабораторной и астрофизической плазмы (ФДП-9) : труды IX белорусско-сербского симпозиума, Минск, 16–21 сентября 2012 г. / Под ред. В.И. Архипенко, В.С. Буракова и В.К. Гончарова − Минск : Ковчег, 2012 г. − С. 79-82
Abstract: In this work we reported the effects of femtosecond laser on the morphology and structure of WTi thin film (thickness of ~190 nm) deposited on single crystal Si(100) wafer. Irradiation was performed in air by linearly polarized and focused femtosecond laser beam. The main characteristics of used laser system: pulse duration 40 fs, pulse repetition rate 1 kHz, wavelength 800 nm. The sample surface was irradiated using maximum energy of 7 μJ per pulse. The results demonstrate the possibility of laser induced periodical surface structures (LIPSS) formation on the thin film surface and on the Si substrate.
URI: http://elib.bsu.by/handle/123456789/228619
ISBN: 978-985-7055-04-3
Appears in Collections:2012. Физика и диагностика лабораторной и астрофизической плазмы (ФДП-9)

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