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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/189346
Title: Microstructure and Raman scattering of Cu2ZnSnSe4 thin films deposited onto flexible metal substrates
Authors: Stanchik, A. V.
Gremenok, V. F.
Bashkirov, S. A.
Tivanov, M. S.
Juškėnas, R. L.
Novikov, G. F.
Giraitis, R.
Saad, A. M.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2018
Publisher: Institute of Physics Publishing
Citation: Semiconductors. – 2018. – Volume 52, No 2 – Pages 215-220.
Abstract: Abstract—Cu2ZnSnSe4 thin films are produced by selenizing electrochemically layer-by-layer deposited and preliminarily annealed Cu–Zn–Sn precursors. For flexible metal substrates, Mo and Ta foils are used. The morphology, elemental and phase compositions, and crystal structure of Cu2ZnSnSe4 films are studied by scanning electron microscopy, X-ray spectral microanalysis, X-ray phase analysis, and Raman spectroscopy.
URI: http://elib.bsu.by/handle/123456789/189346
ISSN: 1063-7826 Print
1090-6479 Online
Appears in Collections:Кафедра физики твердого тела и нанотехнологий (статьи)

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