Предварительный просмотр | Дата выпуска | Заглавие | Автор(ы) |
| ноя-2004 | Microspot x-ray focusing using a short focal-length compound refractive lenses | Dudchik, Y. I.; Kolchevsky, N. N.; Komarov, F. F.; Piestrup, M. A.; Cremer, J. T.; Gary, C. K.; Park, H.; Khounsary, A. M. |
| 2013 | Modeling of Thermal Processing at the Formation of Shallow Doped IC Active Regions | Komarov, A. F.; Velichko, O. I.; Zayats, G. M.; Komarov, F. F.; Miskiewicz, S. A.; Mironov, A. M.; Makarevich, Yu. V. |
| 2007 | Monte Carlo study of influence of channel length and depth on electron transport in SOI MOSFETs | Zhevnyak, Oleg; Borzdov, V. M.; Borzdov, Andrey; Pozdnyakov, Dmitry; Komarov, F. F. |
| 2019 | New Method of Synthesis of ZnSe2O5 Nanocrystals | Akylbekova, A. D.; Usseinov, A. B.; Baymukhanov, Z. K.; Zdorovets, M. V.; Giniyatova, Sh.; Vlasukova, L. A.; Komarov, F. F.; Dauletbekova, A. K. |
| 2011 | Peculiarities of proton transmission through tapered glass capillaries | Komarov, F. F.; Kamyshan, A. S.; Grishin, P. A. |
| 2017 | Radiation degradation of bipolar transistor current gain | Miskiewicz, S. A.; Komarov, A. F.; Komarov, F. F.; Zayats, G. M.; Soroka, S. A. |
| 2001 | Refractive lens for hard X-rays | Dudchik, Yu. I.; Kolchevsky, N. N.; Komarov, F. F. |
| 2014 | Simulation of Radiation Effects in SiO2/Si Structures | Komarov, A. F.; Zayats, G. M.; Komarov, F. F.; Miskiewicz, S. A.; Michailov, V. V. |
| 2015 | Simulation of Radiation Effects in SiO2/Si Structures | Komarov, F. F.; Zayats, G. M.; Komarov, A. F.; Miskiewicz, S. A.; Michailov, V. V.; Komsta, H. |
| 2019 | Structural and emitting properties of Zinc Oxide nanocrystals synthesized by high-fluence ion implantation | Parkhomenko, I. N.; Vlasukova, L. A.; Komarov, F. F.; Makhavikou, M.; Milchanin, O. V.; Wendler, E.; Ronning, C.; Zaph, M.; Korolev, D. S. |
| 2003 | Surface changes of Si[111] single crystals irradiated by high-dose swift heavy ions | Abou AL-Azm, S. M.; Vlasukova, L. A.; Didyk, A. Yu.; Komarov, F. F.; Kozodaev, M. A.; Semina, V. K.; Cheblukov, Yu. N.; Hofman, A.; KhaIiI, A. |
| 2014 | Threshold and criterion for ion track etching in SiO2layers grown on Si | Vlasukova, L. A.; Komarov, F. F.; Yuvchenko, V. N.; Wesch, W.; Wendler, E.; Didyk, A. Yu.; Skuratov, V. A.; Kislitsin, S. B. |
| 2015 | Track nanotechnology and nanoelectronics : textbook / F. F. Komarov, A. V. Leontyev | Комаров, Фадей Фадеевич; Леонтьев, Александр Викторович; Komarov, F. F.; Leontyev, A. V. |
| 2007 | Using of a microcapillary refractive X-ray lens for focusing and imaging | Dudchik, Yu. I.; Komarov, F. F.; Piestrup, M. A.; Gary, C. K.; Park, H.; Cremer, J. T. |
| ноя-1999 | X-ray focusing test and x-ray imaging test by a microcapillary x-ray lens at an undulator beamline | Kohmura, Yoshiki; Awaji, Mitsuhiro; Suzuki, Yoshio; Ishikawa, Tetsuya; Dudchik, Yu. I.; Kolchevsky, N. N.; Komarov, F. F. |
| 2008 | X-Ray “Knife” as a Submicrometer Tool for Studying Focusing Lens Quality | Artemiev, A. N.; Maevskii, A. G.; Artemiev, N. A.; Demkiv, A. A.; Dudchik, Yu. I.; Zabelin, A. V.; Kirillov, B. Ph.; Kvardakov, V. V.; Komarov, F. F.; Naida, O. V.; Porokhova, A. V. |