Please use this identifier to cite or link to this item:
https://elib.bsu.by/handle/123456789/48358Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Konarski, Piotr | - |
| dc.contributor.author | Miśnik, Maciej | - |
| dc.date.accessioned | 2013-10-04T13:06:02Z | - |
| dc.date.available | 2013-10-04T13:06:02Z | - |
| dc.date.issued | 2013 | - |
| dc.identifier.uri | http://elib.bsu.by/handle/123456789/48358 | - |
| dc.description.abstract | New applications of ion bombardment in secondary ion mass spectrometry (SIMS) are reviewed. Recent development and application of cluster ion bombardment in SIMS method are discussed. Also discussed is recently developed, one of quantitative SIMS techniques – “storing matter” technique. Presented is new design quadrupole based SIMS spectrometer allowing to perform “storing matter” technique in one analytical chamber. Examples of depth profile analysis of Cr implanted inconel 600 alloy obtained with the use of ‘standard’ and ‘storing matter’ SIMS are presented. | ru |
| dc.language.iso | en | ru |
| dc.subject | ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика | ru |
| dc.title | Ion bombardment techniques - recent developments in SIMS | ru |
| Appears in Collections: | 2013. Взаимодействие излучений с твердым телом | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Konarski .pdf | 251,87 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.