X-Ray Analysis of IPIB Instability and IPIB Irradiation Influences on Target Surface Microstructure

Abstract

Scanning electron microscope (SEM) and atomic force microscope (AFM) are usually used to analyze the surface and cross-section morphology of ceramics under IPIB treatment. X-ray diffraction (XRD) is an efficient method for analysis of phase structure of ceramics after IPIB irradiation. A modified layer with thickness of around 1 μm would be created after IPIB irradiation. Cracks and craters are main defects produced by IPIB irradiation. The anisotropy of materials would impact the formation of defects. The cracks on single crystal silicon appear in quadrilateral shape. While the shape of cracks on ceramics which is polycrystal is irregular. 6-fold rotational symmetrical crater can be formed on single crystal silicon due to its anisotropy in thermal conductivity. The phase structure in near-surface region would be more heavily influenced comparing the results of XRD and GIXRD analysis which indicate that the main working region of IPIB focus on the near-surface region