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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/28058
Title: FOCUSED ION BEAM IMPLANTATION OF Er-IONS IN NON-CONDUCTING SOLIDS
Authors: Kukharchyk, Nadezhda P.
Wieck, Andreas Dirk
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2011
Citation: Взаимодействие излучений с твердым телом = Interaction of Radiation with Solids: Материалы 9-й Междунар. конф., 20-22 сент. 2011 г. — Минск,2011.
Abstract: The implantation of single Er-ions in dielectrics is a very promising tool for the creation of future quantum information processing devices. In the following, the influence of surface charges on the focused ion beam is investigated. Different fluences were used and the current on the sample during implantation was measured. As not definite results were obtained, further methods will be provided.
URI: http://elib.bsu.by/handle/123456789/28058
Appears in Collections:2011. Взаимодействие излучений с твердым телом

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