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Please use this identifier to cite or link to this item: https://elib.bsu.by/handle/123456789/170231
Title: Simulation of Radiation Effects in SiO2/Si Structures
Authors: Komarov, A. F.
Zayats, G. M.
Komarov, F. F.
Miskiewicz, S. A.
Michailov, V. V.
Keywords: ЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физика
Issue Date: 2014
Publisher: Sumy State University
Citation: Proceedings of the international conference nanomaterials: applications and properties. - 2014. - Vol. 3, No 1. - 01PISERE04(4pp)
Abstract: We describe space-time evolution of electric charge induced in dielectric layer of simulated metal-insulator-semiconductor structures due to irradiation with X-rays. The system of equations used as a basis of the simulation model is solved iteratively by efficient numerical method. The obtained simulation results correlate well with the respective data presented in other scientific publications
URI: http://elib.bsu.by/handle/123456789/170231
ISSN: 2304-1862
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