Profile analysis of microparticles

Abstract

Depth resolved analyses of several types of microparticles are presented. Particles for secondary ion mass spectrometry (SIMS) depth profile analysis were collected in the working environment of glass plant, steelwrorks and w/elding station using eight-stage cascade impactor with particle size range of 0.3 ц т to 15 цт. Ion beam sputtering and sample rotation technique allowed to describe тофЬоІоду i.e. the elemental structure of collected sub-micrometer particles. Also model particles Iriodin 221 (Merck) were depth profiled. The core-shell structure is found for all types of investigated particles. Steelworks particles consist mainly of iron and manganese cores. At the shells of these microparticles: lead, chlorine and fluorine are found. The particles collected in the glass-works consist mainly of lead-zirconium glass cores covered by carbon and copper. Stainless-steel welding particles compose of iron, manganese and chromium cores covered by a shell rich in carbon, chlorine and fluorine. Sample rotation technique applied mSIMS appears to be an effective tool for environmental microparticle morphology studies.