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|Title:||Description of x-ray reflection and diffraction from periodical multilayers and superlattices by the eigenwave method|
|Authors:||Feranchuk, Ilya D.|
Feranchuk, S. I.
Minkevich, A. A.
|Publisher:||The American Physical Society|
|Citation:||Phys. Rev. B 68 (2003) 235307|
|Abstract:||The analytical solution of recurrent equations for amplitudes of electromagnetic field is found for description of x-ray reflection and diffraction from periodical multilayered media. The method proposed uses the Bloch eigenwaves approach for periodical structure, which reduces considerably the computer time required for simulation of diffracted/reflected x-ray intensity and, therefore, accelerates the fitting trial-and-error procedure for sample model parameters. Numerical examples and fit results for experimental x-ray data are provided to demonstrate the effectiveness of method. A new parameter describing the fluctuation of superlattice period is introduced and its influence on experimental data interpretation is discussed.|
|Appears in Collections:||Кафедра теоретической физики и астрофизики|
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