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dc.contributor.authorBatalov, R. I.-
dc.contributor.authorBayazitov, R. M.-
dc.contributor.authorNurutdinov, R. M.-
dc.contributor.authorShmagin, V. B.-
dc.contributor.authorKrizhkov, D. I.-
dc.contributor.authorIvlev, G. D.-
dc.contributor.authorGaiduk, P. I.-
dc.contributor.authorDezsi, I.-
dc.contributor.authorKotai, E.-
dc.date.accessioned2012-05-25T07:27:46Z-
dc.date.available2012-05-25T07:27:46Z-
dc.date.issued2006-
dc.identifier.citationProceedings of VIII International Conference on Modification of Materials with Particle Beams and Plasma Flows (CMM-8), September 22-26, Tomsk, Russia. - Tomsk, 2006. - pp. 330-332.-
dc.identifier.urihttp://elib.bsu.by/handle/123456789/9983-
dc.description.abstractAbstract – Semiconducting iron disilicide (β FeSi2) is a pro mising material for the fabrication of Si based structures emitting light in the 1.5–1.6 μm telecommunication range. In this work β FeSi2/Si heterostructures were formed by high fluence implantation of n Si (100) single crystals with iron ions (Fe+) followed by treatments of the implanted Si la yers with pulsed laser or ion beams. Structural properties of the obtained heterostructures were studied by X ray diffrac tion, transmission electron microscopy and Rutherford backscattering spectrometry. It is shown that pulsed treat ment leads to the formation of nanocrystalline FeSi2 layers with a cellular structure and nearly uniform composition. On the base of β FeSi2/Si layers, light emitting in the near in frared region p+–Si/β FeSi2/n–Si/n+–Si diode structures were obtained by the implantation of low energy boron and phosphorous ions.ru
dc.language.isoruru
dc.publisherTomskru
dc.subjectЭБ БГУ::ТЕХНИЧЕСКИЕ И ПРИКЛАДНЫЕ НАУКИ. ОТРАСЛИ ЭКОНОМИКИ::Электроника. Радиотехникаru
dc.titleFormation of Light Emitting Iron Disilicide/Silicon Heterostructures by Means of Pulsed Ion and Laser Beamsru
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