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dc.contributor.authorDvornikov, O.V.-
dc.contributor.authorTchekhovski, V.A.-
dc.contributor.authorDziatlau, V.L.-
dc.contributor.authorProkopenko, N.N.-
dc.contributor.authorButyrlagin, N.V.-
dc.date.accessioned2021-05-26T07:57:37Z-
dc.date.available2021-05-26T07:57:37Z-
dc.date.issued2018-
dc.identifier.citationSerbian J Electr Eng 2018;15(2):233-247.ru
dc.identifier.urihttps://elib.bsu.by/handle/123456789/260330-
dc.description.abstractBrief information about the new BiJFet array chip (AC) MH2XA030 intended for accelerated creation of analog integrated circuits (IC), which retain their performance under the influence of penetrating radiation and extremely low temperatures (up to minus 197 °C) is presented. The features of schematic design of two types of DDOAs (OAmp3, OAmp4) are considered. The recommendations on the schematic design of the DDOA are developed taking into account the static characteristics of the field effect and bipolar transistors of the AC under the influence of low temperatures. The amplitude-frequency response of the DDOA and the dependence of the noise voltage on the frequency of Fourier density are given. At a temperature of -197°C cryogenic amplifiers OAmp3 (OAmp4) are characterized by the following parameters: the current consumption is less than 500 μA, the input current is less than 1 fA, the voltage gain is more than 50.000 (200.000), the offset voltage is less than 200 (60) μV. The results of the circuit simulation of the instrumentation amplifier based on DDOA OAmp3 are presented.ru
dc.description.sponsorshipIn the development of amplifiers OAmp3, OAmp4, the results of scientific research conducted at the expense of the grant of the Russian Science Foundation (project No. 16-19-00122) are used. Design of Low-Temperature DDOAs on the Elements of BiJFet Array Chip MH2XA030ru
dc.language.isoenru
dc.publisherUniversity of Kragujevac, Faculty of Scienceru
dc.subjectЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физикаru
dc.titleDesign of low-temperature DDOAs on the elements of BiJFet Array chip MH2XA030ru
dc.typearticleru
dc.rights.licenseCC BY 4.0ru
dc.identifier.DOI10.2298/SJEE1802233D-
dc.identifier.scopus85054382815-
Располагается в коллекциях:Статьи НИУ «Институт ядерных проблем»

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