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dc.contributor.authorPoddubskaya, O.G.-
dc.contributor.authorKuzhir, P.P.-
dc.contributor.authorStepanov, А.V.-
dc.contributor.authorMartynenko, A.A.-
dc.contributor.authorRemnev, G.E.-
dc.date.accessioned2021-04-30T09:16:51Z-
dc.date.available2021-04-30T09:16:51Z-
dc.date.issued2018-
dc.identifier.citationRuss Phys J 2018;61(8):1443-1449.ru
dc.identifier.urihttps://elib.bsu.by/handle/123456789/259247-
dc.description.abstractInteraction of a nanosecond high-intensity pulsed ion beam with thin graphene films on copper substrates is analyzed. Methods of Raman spectroscopy are used to investigate the degree of graphene degradation depending on the integral implanted dose. The role of the substrate in the structural degradation of graphene irradiated by charged particle beams is demonstrated using the software package SRIM, intended for modeling radiative defect cascades under irradiation by charged particle beams, and the data on radiation resistance of graphene available in the literature. © 2018, Springer Science+Business Media, LLC, part of Springer Nature.ru
dc.description.sponsorshipThis work was supported in part by the Russian Foundation for Basic Research (Project No. 17-38-50050) and by the Program H2020 (Project MSCA-RISE-2014 ID 644076 CoExAN).ru
dc.language.isoenru
dc.publisherSpringer New York LLCru
dc.subjectЭБ БГУ::ЕСТЕСТВЕННЫЕ И ТОЧНЫЕ НАУКИ::Физикаru
dc.titleStructural Modification of Graphene on Copper Substrates Irradiated by Nanosecond High-Intensity Ion Beamsru
dc.typearticleru
dc.rights.licenseCC BY 4.0ru
dc.identifier.DOI10.1007/s11182-018-1554-8-
dc.identifier.scopus85057819392-
Appears in Collections:Статьи НИУ «Институт ядерных проблем»

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