Structure and conditions for the formation of fullerite crystallites in Sn-C60 films

Abstract

The structure of tin-fullerite films with different thicknesses of the Sn coating layer (50, 100, 200, 300, 450, and 700 nm) and the conditions for the formation and growth of fullerite crystallites on the tin surface during sample exposure in air have been investigated. The methods of X-ray diffraction; scanning electron, transmission electron, and atomic force microscopy; and X-ray microanalysis were used to reveal changes in the structure and phase composition of the tin-fullerite films. Fullerite crystallites in the form of plates and bolts grown under internal stress have been found on the surface of tin films with thicknesses of 50, 100, and 200 nm. The incubation period of crystallite formation is established to be 12–22 months, depending on the thickness of the tin layer.