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dc.contributor.authorЛевчук, Е. А.-
dc.contributor.authorМакаренко, Л. Ф.-
dc.date.accessioned2019-07-16T09:31:34Z-
dc.date.available2019-07-16T09:31:34Z-
dc.date.issued2014-
dc.identifier.citationСборник научных работ студентов Республики Беларусь "НИРС 2013" / редкол. : А. И. Жук (пред.) [и др.]. - Минск : Изд. центр БГУ, 2014. - С. 26ru
dc.identifier.isbn978-985-553-227-0-
dc.identifier.urihttp://elib.bsu.by/handle/123456789/223927-
dc.language.isoruru
dc.publisherМинск : Изд. центр БГУru
dc.titleПрименение метода конечных элементов для расчета характеристик модели кубита в кремнииru
dc.typearticleru
dc.description.alternativeThe application of the finite element method for simulation the effect of electric field on shallow donor states near the surface of the semiconductor is considered. The influence of geometrical parameters on the ionization potential of the donor is studied. Peculiarities of donor states for different gate configurations are investigatedru
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