Highly concentrated phenanthrenequinone– polymethylmethacrylate composite for thick reflection holograms recording at 532 nm

Abstract

The formation of stable phase reflection holograms in highly-concentrated phenanthrenequinone - polymethylmethacrylate (PQ-PMMA) layers with a thickness of about 100 μm at 532 nm recording wavelength has been investigated. In spite of the low absorbance of the photosensitive material at the long wave edge of the absorption spectrum, a refractive index modulation of 4.2·10−4 close to the practically reachable limit was achieved during the optical recording. Quantitative investigation of thermal and light treatment of the recorded holograms has demonstrated a tenfold increase of the diffraction efficiency (up to 60%) without disturbing the angular selectivity profile.