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PreviewIssue DateTitleAuthor(s)
2015Formation of InAs Nanoclusters in Silicon by High-Dose Ion Implantation: Experimental Data and Simulation ResultsKomarov, A. F.; Komarov, F. F.; Mil’chanin, O. V.; Vlasukova, L. A.; Parkhomenko, I. N.; Mikhailov, V. V.; Mokhovikov, M. A.; Miskevich, S. A.
2016Ion-Beam Formation and Track Modification of InAs Nanoclusters in Silicon and SilicaKomarov, F. F.; Milchanin, O. V.; Skuratov, V. A.; Makhavikou, M. A.; van Vuuren, A. Janse; Neethling, J. N.; Wendler, E.; Vlasukova, L. A.; Parkhomenko, I. N.; Yuvchenko, V. N.
2014Simulation of Radiation Effects in SiO2/Si StructuresKomarov, A. F.; Zayats, G. M.; Komarov, F. F.; Miskiewicz, S. A.; Michailov, V. V.
2012A New Nanoporous Material Based on Amorphous Silicon DioxideVlasukova, L. A.; Komarov, F. F.; Yuvchenko, V. N.; Mil’chanin, O. V.; Didyk, A. Yu.; Skuratov, V. A.; Kislitsyn, S. B.
2015Simulation of Radiation Effects in SiO2/Si StructuresKomarov, F. F.; Zayats, G. M.; Komarov, A. F.; Miskiewicz, S. A.; Michailov, V. V.; Komsta, H.
2014Threshold and criterion for ion track etching in SiO2layers grown on SiVlasukova, L. A.; Komarov, F. F.; Yuvchenko, V. N.; Wesch, W.; Wendler, E.; Didyk, A. Yu.; Skuratov, V. A.; Kislitsin, S. B.
2013Modeling of Thermal Processing at the Formation of Shallow Doped IC Active RegionsKomarov, A. F.; Velichko, O. I.; Zayats, G. M.; Komarov, F. F.; Miskiewicz, S. A.; Mironov, A. M.; Makarevich, Yu. V.
2010Ion Beam Synthesis of InAs Nanocrystals in Crystalline SiliconKomarov, F. F.; Mil’chanin, O. V.; Vlasukova, L. A.; Wesch, V.; Komarov, A. F.; Mudryi, A. V.
2011Peculiarities of proton transmission through tapered glass capillariesKomarov, F. F.; Kamyshan, A. S.; Grishin, P. A.
2008X-Ray “Knife” as a Submicrometer Tool for Studying Focusing Lens QualityArtemiev, A. N.; Maevskii, A. G.; Artemiev, N. A.; Demkiv, A. A.; Dudchik, Yu. I.; Zabelin, A. V.; Kirillov, B. Ph.; Kvardakov, V. V.; Komarov, F. F.; Naida, O. V.; Porokhova, A. V.