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Browsing by Author Komarov, F. F.

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Issue Date	Title	Author(s)
2014	Threshold and criterion for ion track etching in SiO2layers grown on Si	Vlasukova, L. A.; Komarov, F. F.; Yuvchenko, V. N.; Wesch, W.; Wendler, E.; Didyk, A. Yu.; Skuratov, V. A.; Kislitsin, S. B.
2015	Track nanotechnology and nanoelectronics : textbook / F. F. Komarov, A. V. Leontyev	Комаров, Фадей Фадеевич; Леонтьев, Александр Викторович; Komarov, F. F.; Leontyev, A. V.
2007	Using of a microcapillary refractive X-ray lens for focusing and imaging	Dudchik, Yu. I.; Komarov, F. F.; Piestrup, M. A.; Gary, C. K.; Park, H.; Cremer, J. T.
Nov-1999	X-ray focusing test and x-ray imaging test by a microcapillary x-ray lens at an undulator beamline	Kohmura, Yoshiki; Awaji, Mitsuhiro; Suzuki, Yoshio; Ishikawa, Tetsuya; Dudchik, Yu. I.; Kolchevsky, N. N.; Komarov, F. F.
2008	X-Ray “Knife” as a Submicrometer Tool for Studying Focusing Lens Quality	Artemiev, A. N.; Maevskii, A. G.; Artemiev, N. A.; Demkiv, A. A.; Dudchik, Yu. I.; Zabelin, A. V.; Kirillov, B. Ph.; Kvardakov, V. V.; Komarov, F. F.; Naida, O. V.; Porokhova, A. V.

Showing results 25 to 29 of 29 < previous