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Browsing by Author Komarov, F. F.

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Showing results 11 to 29 of 29 < previous 
PreviewIssue DateTitleAuthor(s)
2000Glass capillary X-ray lens: fabrication technique and ray tracing calculationsDudchik, Yu. I.; Kolchevsky, N. N.; Komarov, F. F.; Kohmura, Y.; Awaji, M.; Suzuki, Y.; Ishikava, T.
2010Ion Beam Synthesis of InAs Nanocrystals in Crystalline SiliconKomarov, F. F.; Mil’chanin, O. V.; Vlasukova, L. A.; Wesch, V.; Komarov, A. F.; Mudryi, A. V.
2016Ion-Beam Formation and Track Modification of InAs Nanoclusters in Silicon and SilicaKomarov, F. F.; Milchanin, O. V.; Skuratov, V. A.; Makhavikou, M. A.; van Vuuren, A. Janse; Neethling, J. N.; Wendler, E.; Vlasukova, L. A.; Parkhomenko, I. N.; Yuvchenko, V. N.
Nov-2004Microspot x-ray focusing using a short focal-length compound refractive lensesDudchik, Y. I.; Kolchevsky, N. N.; Komarov, F. F.; Piestrup, M. A.; Cremer, J. T.; Gary, C. K.; Park, H.; Khounsary, A. M.
2013Modeling of Thermal Processing at the Formation of Shallow Doped IC Active RegionsKomarov, A. F.; Velichko, O. I.; Zayats, G. M.; Komarov, F. F.; Miskiewicz, S. A.; Mironov, A. M.; Makarevich, Yu. V.
2007Monte Carlo study of influence of channel length and depth on electron transport in SOI MOSFETsZhevnyak, Oleg; Borzdov, V. M.; Borzdov, Andrey; Pozdnyakov, Dmitry; Komarov, F. F.
2019New Method of Synthesis of ZnSe2O5 NanocrystalsAkylbekova, A. D.; Usseinov, A. B.; Baymukhanov, Z. K.; Zdorovets, M. V.; Giniyatova, Sh.; Vlasukova, L. A.; Komarov, F. F.; Dauletbekova, A. K.
2011Peculiarities of proton transmission through tapered glass capillariesKomarov, F. F.; Kamyshan, A. S.; Grishin, P. A.
2017Radiation degradation of bipolar transistor current gainMiskiewicz, S. A.; Komarov, A. F.; Komarov, F. F.; Zayats, G. M.; Soroka, S. A.
2001Refractive lens for hard X-raysDudchik, Yu. I.; Kolchevsky, N. N.; Komarov, F. F.
2014Simulation of Radiation Effects in SiO2/Si StructuresKomarov, A. F.; Zayats, G. M.; Komarov, F. F.; Miskiewicz, S. A.; Michailov, V. V.
2015Simulation of Radiation Effects in SiO2/Si StructuresKomarov, F. F.; Zayats, G. M.; Komarov, A. F.; Miskiewicz, S. A.; Michailov, V. V.; Komsta, H.
2019Structural and emitting properties of Zinc Oxide nanocrystals synthesized by high-fluence ion implantationParkhomenko, I. N.; Vlasukova, L. A.; Komarov, F. F.; Makhavikou, M.; Milchanin, O. V.; Wendler, E.; Ronning, C.; Zaph, M.; Korolev, D. S.
2003Surface changes of Si[111] single crystals irradiated by high-dose swift heavy ionsAbou AL-Azm, S. M.; Vlasukova, L. A.; Didyk, A. Yu.; Komarov, F. F.; Kozodaev, M. A.; Semina, V. K.; Cheblukov, Yu. N.; Hofman, A.; KhaIiI, A.
2014Threshold and criterion for ion track etching in SiO2layers grown on SiVlasukova, L. A.; Komarov, F. F.; Yuvchenko, V. N.; Wesch, W.; Wendler, E.; Didyk, A. Yu.; Skuratov, V. A.; Kislitsin, S. B.
2015Track nanotechnology and nanoelectronics : textbook / F. F. Komarov, A. V. LeontyevКомаров, Фадей Фадеевич; Леонтьев, Александр Викторович; Komarov, F. F.; Leontyev, A. V.
2007Using of a microcapillary refractive X-ray lens for focusing and imagingDudchik, Yu. I.; Komarov, F. F.; Piestrup, M. A.; Gary, C. K.; Park, H.; Cremer, J. T.
Nov-1999X-ray focusing test and x-ray imaging test by a microcapillary x-ray lens at an undulator beamlineKohmura, Yoshiki; Awaji, Mitsuhiro; Suzuki, Yoshio; Ishikawa, Tetsuya; Dudchik, Yu. I.; Kolchevsky, N. N.; Komarov, F. F.
2008X-Ray “Knife” as a Submicrometer Tool for Studying Focusing Lens QualityArtemiev, A. N.; Maevskii, A. G.; Artemiev, N. A.; Demkiv, A. A.; Dudchik, Yu. I.; Zabelin, A. V.; Kirillov, B. Ph.; Kvardakov, V. V.; Komarov, F. F.; Naida, O. V.; Porokhova, A. V.