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Please use this identifier to cite or link to this item: http://elib.bsu.by/handle/123456789/14577
Title: Anomalous scattering method in crystallography on the basis of parametric X-radiation
Authors: Feranchuk, Ilya D.
Ulyanenkov, A.
Issue Date: 2005
Publisher: International Union of Crystallography
Citation: Acta Cryst. A. 61 (2005) 125-133
Abstract: Spectra of parametric X-radiation (PXR) in the range of anomalous dispersion of atoms of a crystallographic unit cell are theoretically analyzed. Characteristics of PXR are calculated for both ultrarelativistic (E>=50 MeV) and nonrelativistic (E~=100 keV) electrons interacting with complex organic crystals. The analysis of the PXR angular distribution is shown to permit the realization of the anomalous scattering method for the direct measurement of structure amplitude phases.
URI: http://elib.bsu.by/handle/123456789/14577
Appears in Collections:Кафедра теоретической физики и астрофизики

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